EE380: EC Lab
Exp. 3 : Extraction of BJT Model
parameters
B. Mazhari
Dept. of EE, IIT Kanpur
1G-Number
B. Mazhari, IITK
SPECS.
Simplified Device
Design Process Model
Circuit
Schematic
Circuit Device
Simulation Model
Predicted
Results
No Specs.
Satisfied?
Yes
2G-Number
B. Mazhari, IITK
1. Measurement of current Gain β
Measure VBE and VCEsat also
3G-Number
B. Mazhari, IITK
2. Measure reverse active current Gain βr and base
collector forward voltage drop
4G-Number
B. Mazhari, IITK
3. Display IC vs. VCE Characteristics on CRO for a fixed
I B.
2.5
IC (mA) 2.0
1.5
1.0
0.5
0.0
0.0 0.2 0.4 0.6 0.8 1.0
VCE(V)
5G-Number
B. Mazhari, IITK
Circuit Diagram
Assumption IC ~ IE 6G-Number
B. Mazhari, IITK
10
6
-V O (V)
0
0.00 0.25 0.50 0.75 1.00
VCE(V)
7G-Number
B. Mazhari, IITK
Some Incorrect Plots
2.5 5
2.0 4
1.5 3
-VO(V)
-VO
1.0 2
0.5 1
0
0.0
0 2 4 6 8 10 12
0.08 0.10 0.12 0.14 0.16 0.18 0.20
VCE VCE(V)
Collector resistance too large Collector resistance too small
12
10
6
-VO
0 2 4 6 8 10
VCE(V)
Feedback resistor too large 8G-Number
B. Mazhari, IITK
4. Measurement of VA
VBE
VCE
I C I S (1 )e VT
VA
IC
-VA VCE
9G-Number
B. Mazhari, IITK
Estimation of VA through measurement of small signal
output resistance rO
V
VCE BE
VCE vce
I C I S (1 ) e VT ro IB VA I C ro
VA I C ic
10
G-Number
B. Mazhari, IITK
5. Measure thermal voltage VT and saturation current IS
VBE
IC I S e VT
Measure for R1 of 10k and 100k
11
G-Number
B. Mazhari, IITK